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We enable highly accurate semiconductor and FPD inspection with our image processing technology.
- Wafer inspection system "INSPECTRA®" series
- Wafer Internal Inspection System "INSPECTRA® IR" Series
- Chip Inspection System GEN3000T
- Review System "RV-3000"
- Luminescence Defect Inspection System "INSPECTRA® PL" Series
- High-speed Bump Measurement system "MB-3000"
- Surface Profiler measurement system "SP series"
- Organic Pattern Inspection System TB series
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